XRD Measurement of 90° Domain Reorientation and Domain Contribution to the Electric-Field-Induced Strain in PZT Ceramics

Key Engineering Materials

Volumn 157-158, Issue , 1999, Pages 73-80

  Tsurumi, T ^a   Kumano, Y ^b   Ikeda, N ^a   Ohashi, N ^a   Fukunaga, O ^c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b PANASONIC CORPORATION   (Japan)

^c Ace Tech Company   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344819996     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Article

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