β-Donor Bonds in Compounds Containing SiON Fragments

Angewandte Chemie (International Edition in English)

Volumn 36, Issue 24, 1997, Pages 2807-2809

  Mitzel, Norbert W ^a   Losehand, Udo ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Donor acceptor bonds; Hydrides; Hydroxylamines; Silicon; Structure elucidation

Indexed keywords

EID: 0344757769     PISSN: 05700833     EISSN: None     Source Type: Journal    
DOI: 10.1002/anie.199728071     Document Type: Article

References (13)

1. N. W. Mitzel, A. J. Blake, D. W. H. Rankin, J. Am. Chem. Soc. 1997, 119, 4143-4148.
2. a) J. Patzke, E. Wohlfarth, Chem.-Ztg. 1973, 97, 176-180;
3. b) H. Lücke, Adhäsion 1968, 12, 353-365.
4. M. G. Voronkov, E. A. Maletina, V. K. Roman, Heterosiloxanes: Derivatives of Nitrogen and Phosphorus, Vol. 2, Harwood Academic Publishers. Chur, 1991.
5. Y. Hamada, S. Mori, Proc. 29th Organosilicon Symp., Evanston, IL, USA, 1996.
6. -3.
7. J. Emsley, The Elements, Clarendon, Oxford, 1989.
8. M. J. Barrow, E. A. V. Ebsworth, M. M. Harding, Acta Crystallogr. Sect. B 1979, 35, 2093-2099.
9. A. J. Blake, M. Dyrbush, E. A. V. Ebsworth, S. G. D. Henderson, Acta Crystallogr. Sect. C 1988, 44, 1-3.
10. N. W. Mitzel, E. Breuning, A. J. Blake, H. E. Robertson, B. A. Smart, D. W. H. Rankin, J. Am. Chem. Soc. 1996, 118, 2664-2668.
11. Calculations were performed using standard methods implemented in Gaussian 94: M. J. Frisch, G. W. Trucks, H. B. Schlegel, P. M. W. Gill, B. G. Johnson, M. A. Robb. J. R. Cheeseman, T. Keith, G. A. Petersson, J. A. Montgomery, K. Raghavachari, M. A. Al-Laham, V. G. Zakrzewski, J. V. Ortiz, J. B. Foresman, J. Cioslowski, B. B. Stefanov, A. Nanayakkara, M. Challacombe, C. Y. Peng, P. Y. Ayala, W. Chen, M. W. Wong, J. L. Andres, E. S. Replogle, R. Gomperts, R. L. Martin, D. J. Fox, J. S. Binkley, D. J. Defrees, J. Baker, J. P. Stewart, M. Head-Gordon, C. Gonzalez, J. A. Pople, Gaussian 94, Revision C.2, Gaussian, Pittsburgh, PA, USA, 1995.
12. G. M. Sheldrick, SHELXTL/PC, Version 5.03. Siemens Analytical X-Ray Instrumentation, Madison, WI, USA, 1995.
13. G. M. Sheldrick, SHELX93, Universität Göttingen, 1993.