Combined synthesis of easily testable datapath and control designs

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 1992, Pages 187-192

  Mftra, Blswadlp ^a   Chaudhurl, P Pal ^b  

^a TEXAS INSTRUMENTS   (India)

^b Dept of Computer Sc and Engg ^*  (India)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; ECONOMIC AND SOCIAL EFFECTS; STOCHASTIC SYSTEMS; VLSI CIRCUITS;

COMBINATIONAL LOGIC; CONTROL SYNTHESIS; EFFICIENT SCHEMES; HIGH LEVEL DESCRIPTION; OPTIMIZATION ALGORITHMS; SIMULTANEOUS SCHEDULING; STOCHASTIC EVOLUTION; TEXAS INSTRUMENTS;

COMPUTER CIRCUITS;

EID: 0344728612     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICVD.1992.658045     Document Type: Conference Paper

References (13)

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