Structure-property relationship for excimer formation in poly(alkylfluorene) derivatives

Synthetic Metals

Volumn 101, Issue 1, 1999, Pages 126-

  Lee, Jeong Ik ^a   Klaerner, Gerrit ^a   Miller, Robert D ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ANNEALING; BAND STRUCTURE; FLUORESCENCE; MOLECULAR WEIGHT; OPTICAL VARIABLES MEASUREMENT; PHOTOLUMINESCENCE; POLYMERIZATION; STRUCTURE (COMPOSITION); SYNTHESIS (CHEMICAL); THERMODYNAMIC STABILITY; CONDUCTIVE FILMS; DERIVATIVES; FLUORINE CONTAINING POLYMERS; NICKEL; PLASTIC FILMS;

EXCIMER FORMATION; POLYALKYLFLUORENE DERIVATIVES; STRUCTURE PROPERTY RELATIONSHIP;

FLUORINE CONTAINING POLYMERS; CONDUCTIVE PLASTICS;

HOMOPOLYMERS; POLYFLUORENE;

EID: 0344718511     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(98)01365-4     Document Type: Article

References (2)

1. Q. Pei, Y. Yang, J. Am. Chem. Soc., 118 (1996) 7416.
2. D.D.C. Bradley, M. Grell, X. Long, H. Mellor, A. Grice, M. Inbasekaran, E. P. Woo, SPIE Proc., 3145 (1997) 254.