Study of dislocations in silicon carbide single crystals by polarized optical method

Zavodskaya Laboratoriya. Diagnostika Materialov

Volumn 69, Issue 1, 2003, Pages 24-30

  Drozdov, Yu A ^a   Okunev, A O ^a   Tkal', V A ^a   Shul'pina, I L ^a  

^a NONE

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EID: 0344686186     PISSN: 03214265     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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