Production and characterization of nanosized Cu/O/SiC composite particles in a thermal r.f. plasma reactor

Journal of Materials Science

Volumn 34, Issue 5, 1999, Pages 925-931

  Buchner, P ^a   Lutzenkirchen Hecht D ^a   Strehblow, H H ^a   Uhlenbusch, J ^a  

^a HEINRICH HEINE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CHEMICAL ANALYSIS; COMPOSITION; COPPER; ELECTRON ENERGY LEVELS; ENERGY DISPERSIVE SPECTROSCOPY; PARTICLE SIZE ANALYSIS; PLASMA APPLICATIONS; SILICON CARBIDE; SYNTHESIS (CHEMICAL); X RAY PHOTOELECTRON SPECTROSCOPY; X RAY POWDER DIFFRACTION;

THERMAL PLASMA PROCESS; X RAY ABSORPTION FINE STRUCTURE ANALYSIS;

NANOSTRUCTURED MATERIALS;

EID: 0344671681     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004567222116     Document Type: Article

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