BINTEST - Binary Search-based Test Case Generation

Proceedings - IEEE Computer Society's International Computer Software and Applications Conference

Volumn , Issue , 2003, Pages 28-33

  Beydeda, Sami ^a   Gruhn, Volker ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; BINARY SEQUENCES; COMPUTATIONAL COMPLEXITY; ERROR ANALYSIS; ITERATIVE METHODS; OBJECT ORIENTED PROGRAMMING; SOFTWARE ENGINEERING; SYNTACTICS;

BINARY SEARCH-BASED TEST CASE GENERATION (BINTEST) ALGORITHMS; DYNAMIC TESTS;

COMPUTER SOFTWARE;

EID: 0344666719     PISSN: 07303157     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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