Evaluation of low-temperature interdiffusion coefficients in Hg-based superlattices by monitoring the E1 reflectance peak

Journal of Electronic Materials

Volumn 26, Issue 6, 1997, Pages 578-583

  Mattson, M A ^a   Myers, T H ^a   Richards Babb, M ^a   Meyer, J R ^b  

^a WEST VIRGINIA UNIVERSITY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

HgTe CdTe superlattice; k p calculation; Low temperature interdiffusion; Molecular beam epitaxy

Indexed keywords

EID: 0344659400     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-997-0197-2     Document Type: Review

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