On the applicability of the x-ray diffraction line profile analysis in extracting grain size and microstrain in nanocrystalline materials

Journal of Materials Research

Volumn 14, Issue 2, 1999, Pages 549-559

  Jiang, H G ^a   Ruhle M ^b   Lavernia, E J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; DISLOCATIONS (CRYSTALS); GRAIN SIZE AND SHAPE; HOT ISOSTATIC PRESSING; IRON; POWDER METALS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

COLD PRESSING; INTEGRAL BREADTH ANALYSIS; MICROSTRAIN; SCHERRER EQUATION; SINGLE LINE APPROXIMATION;

NANOSTRUCTURED MATERIALS;

EID: 0344641978     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1999.0079     Document Type: Article

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