Automatic edge detection using 3 × 3 ideal binary pixel patterns and fuzzy-based edge thresholding

Pattern Recognition Letters

Volumn 25, Issue 1, 2004, Pages 101-106

  Kim, Dong Su ^a   Lee, Wang Heon ^a   Kweon, In So ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Edge confidence measure; Fuzzy based edge thresholding; Ideal binary pattern

Indexed keywords

FUZZY SETS; IMAGE PROCESSING; TABLE LOOKUP;

BINARY PIXEL PATTERNS;

EDGE DETECTION;

IMAGE ANALYSIS;

EID: 0344551941     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patrec.2003.09.010     Document Type: Article

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