Radiometry using a platinum silicide detector

Optical Engineering

Volumn 36, Issue 1, 1997, Pages 235-242

  Sanders Reed, John N ^a  

^a SVS R and D Systems Inc   (United States)

Author keywords

Infrared; PtSi; Radiometry

Indexed keywords

EID: 0344521109     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601166     Document Type: Article

References (11)

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