|
Volumn 203, Issue , 2003, Pages 136-140
|
Swift heavy ion-induced modification of Al2O3 and MgO surfaces
|
Author keywords
Atomic force microscopy; Electron microscopy; Heavy ion irradiation; Ionizing energy loss; Radiation defects; Surface
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTALLINE MATERIALS;
ELECTRON DIFFRACTION;
HIGH RESOLUTION ELECTRON MICROSCOPY;
IONS;
MAGNESIA;
SINGLE CRYSTALS;
SURFACE TOPOGRAPHY;
TRANSMISSION ELECTRON MICROSCOPY;
ION-INDUCED MODIFICATION;
ALUMINA;
|
EID: 0344520226
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)02197-3 Document Type: Conference Paper |
Times cited : (46)
|
References (8)
|