Effect of magnetic field on the magnetic properties of electroplated NiFe/Cu composite wires

Journal of Applied Physics

Volumn 94, Issue 10, 2003, Pages 6655-6658

  Li, X P ^a   Zhao, Z J ^a   Seet, H L ^a   Heng, W M ^a   Oh, T B ^a   Lee, J Y ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC SOFTNESS; MAGNETOIMPEDANCE;

ELECTROPLATING; MAGNETIC ANISOTROPY; MAGNETIC FIELD EFFECTS; MICROSTRUCTURE; THIN FILMS; WIRE;

NICKEL ALLOYS;

EID: 0344515420     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1621084     Document Type: Article

References (15)

1. K. Mohri, T. Kohhzawa, K. Kawashima, H. Yoshida, and L. V. Panina, IEEE Trans. Magn. 28, 3150 (1992).
2. X. L. Yang, J. X. Yang, G. Chen, G. T. Shen, B. Y. Hu, and K. Y. Jiang, J. Magn. Magn. Mater. 175, 285 (1997).
3. M. Vazquez, D. X. Chen, and A. Hernando, Phys. Rev. B 50, 16737 (1994).
4. P. Ruuskanen, A. Deribas, A. Shtertser, and T. Korkala, J. Magn. Magn. Mater. 182, 185 (1998).
5. R. L. Sommer and C. L. Chien, Appl. Phys. Lett. 67, 3346 (1995).
6. R. S. Beach, N. Smith, C. L. Platt, F. Jeffers, and A. E. Berkowitz, Appl. Phys. Lett. 68, 2753 (1996).
7. G. V. Kurlyandskaya, J. M. Barandiaran, J. L. Munoz, J. Gutierrez, M. Vazquez, D. Garcia, and V. O. Vaskovskiy, J. Appl. Phys. 87, 4822 (2000).
8. X. P. Li, Z. J. Zhao, S. Ang, T. B. Oh, T. W. Song, W. C. Ng, S. J. Koh, and J. Y. Lee, Mater. Sci. Forum 437-438, 57 (2003).
9. H. L. Seet, S. H. See, X. P. Li, J. Y. Lee, K. Y. T. Lee, S. H. Teoh, and C. T. Lim, Mater. Sci. Forum 437-438, 479 (2003).
10. X. P. Li, Z. J. Zhao, S. Ang, S. J. Koh, T. B. Oh, J. Y. Lee, and W. X. Chen, Mater, Sci. Forum 437-438, 61 (2003).
11. X. P. Li, Z. J. Zhao, H. L. Seet, W. M. Heng, T. B. Oh, and J. Y. Lee, Electrochem. Solid-State Lett. (to be published).
12. T. Z. Fahidy, Prog. Surf. Sci. 68, 155 (2001).
13. J. M. D. Coey and G. Hinds, J. Alloys Compd, 326, 238 (2001).
14. S. S. Yoon, S. C. Yu, G. H. Ryu, and C. G. Kim, J. Appl. Phys. 85, 5432 (1999).
15. J. M. Barandiarán, A. García-Arribas, J. L. Muñoz, and G. V. Kurlyandskaya, IEEE Trans. Magn. 38, 3051 (2002).