Intelligent Sensor Management to Minimize Detection Error

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5096, Issue , 2003, Pages 502-513

  Wegrzyn, John ^a   Kastella, Keith ^a  

^a Veridian Systems Division   (United States)

Author keywords

Bayesian Probability Updating; Classification Error; Discrimination; Performance Optimization; Remote Sensing; Sequential Probability Ratio Test (SPRT)

Indexed keywords

ALGORITHMS; HEURISTIC METHODS; OPTIMIZATION; PROBABILITY; REMOTE SENSING;

BAYESIAN PROBABILITY; SENSOR MANAGEMENT;

SENSORS;

EID: 0344514545     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.501108     Document Type: Conference Paper

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