Material grain noise analysis by using higher-order statistics

Signal Processing

Volumn 84, Issue 1, 2004, Pages 197-205

  Miralles, Ramón ^a   Vergara, Luis ^a   Gosalbez, Jorge ^a  

^a UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

Backscattering noise; Higher order statistics; Material characterization

Indexed keywords

BACKSCATTERING; SPURIOUS SIGNAL NOISE; STATISTICAL METHODS; TRANSDUCERS; ULTRASONICS;

BACKSCATTERING NOISE; SCATTERER DENSITY;

SIGNAL PROCESSING;

EID: 0344494047     PISSN: 01651684     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sigpro.2003.10.007     Document Type: Article

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