Static electrification of solid oxide in liquid metal and electrical double layer at the interface

Journal of Colloid and Interface Science

Volumn 269, Issue 2, 2004, Pages 354-357

  Paik, Young Hyun ^a   Yoon, Wu J ^a   Shin, Ho C ^a  

^a Korea University   (South Korea)

Author keywords

Electrical double layer; Excess electron density; Liquid metal; Oxide inclusion; Static electrification

Indexed keywords

CARRIER CONCENTRATION; DIFFUSION; ELECTRON TRANSITIONS; INTERFACES (MATERIALS); MERCURY (METAL); SEMICONDUCTOR MATERIALS;

SURFACE CHARGES;

LIQUID METALS;

MERCURY; METAL; OXIDE;

ARTICLE; CHEMICAL PARAMETERS; ELECTRIC POTENTIAL; ELECTRICITY; ELECTRON; ELECTRON TRANSPORT; LIQUID; PRIORITY JOURNAL; ROOM TEMPERATURE; SOLID; SURFACE CHARGE; SURFACE PROPERTY;

EID: 0344493874     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0021-9797(03)00629-5     Document Type: Article

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