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Volumn 17, Issue 22-24 I, 2003, Pages 3977-3987
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Branching and fringing in microstructure electron flow
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CONFERENCE PAPER;
ELECTRIC CONDUCTIVITY;
ELECTRON TRANSPORT;
GAS;
IMAGE QUALITY;
IMAGING SYSTEM;
QUANTUM MECHANICS;
SEMICONDUCTOR;
STRUCTURE ANALYSIS;
THERMAL STIMULATION;
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EID: 0344444261
PISSN: 02179792
EISSN: None
Source Type: Journal
DOI: 10.1142/s0217979203021964 Document Type: Conference Paper |
Times cited : (26)
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References (7)
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