Observation of antiparallel polarization reversal using a scanning nonlinear dielectric microscope

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 9 B, 2003, Pages 6214-6217

  Morita, Takeshi ^a   Cho, Yasuo ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Antiparallel poling reversal; Data storage; Ferroelectric thin film; Nanodot; Scanning nonlinear dielectric microscope

Indexed keywords

DATA STORAGE EQUIPMENT; ELECTRODES; MICROSCOPIC EXAMINATION; PIEZOELECTRICITY; POLARIZATION; REACTION KINETICS; THICKNESS MEASUREMENT;

ANTIPARALLEL POLARIZATION REVERSAL; FORMING MECHANISM; SCANNING NONLINEAR DIELECTRIC MICROSCOPE;

FERROELECTRIC THIN FILMS;

EID: 0344309082     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.6214     Document Type: Article

References (9)

1. Y. Cho, K. Matsuura, N. Valanoor and R. Ramesh: Proc. 7th Int. Symp. Ferroic Domains and Mesoscopic Structures (ISFD7) (2002) B50P03.
2. F. Jona and G. Shirane: Ferroelectric Crystals (The Macmillan Company, New York, 1962) p. 46.
3. A. Gruverman, O. Auciello, R. Ramesh and T. Tokumoto: Nanotechnology 8 (1997) A38.
4. Y. Cho: Integr. Ferroelectr. 50 (2002) 89.
5. Y. Cho, S. Kazuta and H. Ito: Appl. Phys. Lett. 79 (2001) 2955.
6. K. Matsuura, Y. Cho and H. Odagawa: Jpn. J. Appl. Phys. 40 (2001) 3534.
7. Y. Hiranaga, K. Fujimoto, Y. Wagatsuma, Y. Cho, A. Onoe, K. Terabe and K. Kitamura: Proc. Mater. Res. Soc. Symp. 748 (2003) U5.5.1.
8. Y. Cho, K. Fujimoto, Y. Hiranaga, Y. Wagatsuma, A. Onoe, K. Terabe, and K. Kitamura: Appl. Phys. Lett. 81 (2002) 4401.
9. M. Abplanalp, J. Fousek and P. Gunter: Phys. Rev. Lett. 86 (2001) 5799.