Optical and structural evidence of the grain-boundary influence on the disorder of polycrystalline CdTe films

Applied Physics Letters

Volumn 74, Issue 20, 1999, Pages 2957-2959

  Iribarren, A ^a   Castro Rodriguez R ^b   Caballero Briones, F ^b   Pena J L ^b  

^a UNIVERSITY OF HAVANA   (Cuba)

^b DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CARRIER CONCENTRATION; ELECTRON TRAPS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; NUMERICAL ANALYSIS; ORDER DISORDER TRANSITIONS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING CADMIUM TELLURIDE; X RAY CRYSTALLOGRAPHY;

FULL WIDTH AT HALF MAXIMUM (FWHM); POLYCRYSTALLINE FILMS; TRAP DISTRIBUTION;

SEMICONDUCTING FILMS;

EID: 0344183067     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123978     Document Type: Article

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