Interfacial defects in thin refractory metal films imaged by low-energy electron microscopy

Applied Physics Letters

Volumn 74, Issue 18, 1999, Pages 2626-2628

  Swiech W ^a   Mundschau, M ^a   Flynn, C P ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRON MICROSCOPY; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; REFRACTORY MATERIALS; SAPPHIRE; SUBSTRATES; THIN FILMS;

LOW ENERGY ELECTRON MICROSCOPY (LEEM);

METALLIC FILMS;

EID: 0344183055     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123918     Document Type: Article

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