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physica status solidi (a)

Volumn 140, Issue 2, 1993, Pages 421-427

In‐situ X‐ray measurements of relaxation processes in Si1‐xGex layers on si substrate

(1) Zaumseil, P a

a IHP (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344180000 PISSN: 00318965 EISSN: 1521396X Source Type: Journal
DOI: 10.1002/pssa.2211400212 Document Type: Article

Times cited : (14)

References (13)

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7
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13
- 0004665052
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- Jang, S.‐M.¹ Kim, H.‐W.² Reif, R.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.