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Volumn 32, Issue 12, 2003, Pages 2321-2338

Uniqueness of the Maximum Likelihood Estimate of the Weibull Distribution Tampered Failure Rate Model

Author keywords

Maximum likelihood estimate; Monte Carlo simulation; Multiple step stress; TFR model; Weibull distribution

Indexed keywords

COMPUTER SIMULATION; FAILURE ANALYSIS; MONTE CARLO METHODS; PARAMETER ESTIMATION; STATISTICAL METHODS; WEIBULL DISTRIBUTION;

EID: 0344119556     PISSN: 03610926     EISSN: None     Source Type: Journal    
DOI: 10.1081/STA-120025381     Document Type: Article
Times cited : (22)

References (5)
  • 1
    • 81255155615 scopus 로고
    • Tampered failure rate model for step-stress accelerated life test
    • Bhattacharyya, G. K., Soejoeti, Z. A. (1989). Tampered failure rate model for step-stress accelerated life test. Commun. Statist. - Theory Meth. 18(5):1627-1643.
    • (1989) Commun. Statist. - Theory Meth. , vol.18 , Issue.5 , pp. 1627-1643
    • Bhattacharyya, G.K.1    Soejoeti, Z.A.2
  • 2
    • 0000714520 scopus 로고
    • Bayesian estimation and optimal designs in partially accelerated life testing
    • DeGroot, M. H., Goel, P. K. (1979). Bayesian estimation and optimal designs in partially accelerated life testing. Naval Research logistics Quarterly 26:223-235.
    • (1979) Naval Research Logistics Quarterly , vol.26 , pp. 223-235
    • Degroot, M.H.1    Goel, P.K.2
  • 3
    • 84896838005 scopus 로고
    • Multiple step-stress accelerated life test: The tampered failure rate model
    • Madi, M. T. (1993). Multiple step-stress accelerated life test: the tampered failure rate model. Commun. Statist. - Theory Meth. 22(9):2631-2639.
    • (1993) Commun. Statist. - Theory Meth. , vol.22 , Issue.9 , pp. 2631-2639
    • Madi, M.T.1
  • 4
    • 33644994040 scopus 로고    scopus 로고
    • Accelerated life test (in Chinese)
    • Mao, S., Wang, L. (1997). Accelerated life test (in Chinese). Publishing House of Science 66-69, 137.
    • (1997) Publishing House of Science , vol.66-69 , pp. 137
    • Mao, S.1    Wang, L.2
  • 5
    • 0019026625 scopus 로고
    • Accelerated life testing step-stress models and data analysis
    • Nelson, W. (1980). Accelerated life testing step-stress models and data analysis. IEEE Traus. on Reliability. 29:103-108.
    • (1980) IEEE Traus. on Reliability , vol.29 , pp. 103-108
    • Nelson, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.