Statistical aspects of lifetime in the presence of UV radiation

Journal of Electronic Packaging

Volumn 125, Issue 1, 2003, Pages 1-3

  Zeifman, Michael I ^a   Ingman, Dov ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK PROPAGATION; DETERIORATION; FAILURE ANALYSIS; FIBER OPTICS; MATHEMATICAL MODELS; POLYMERS; RELIABILITY; STATISTICAL MECHANICS; STRESS ANALYSIS; WEIBULL DISTRIBUTION;

DAMAGE ACCUMULATION; LIFETIME DISTRIBUTION; STRESS RUPTURE;

ULTRAVIOLET RADIATION;

EID: 0344119469     PISSN: 10437398     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1498263     Document Type: Article

References (11)

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