-
1
-
-
0345403337
-
-
Lipkowski, J., Ross, P. N., Jr., Eds.; Wiley-VCH Publishers: New York, Chapter 2
-
Ross, P. N., Jr. In Frontiers of Electrochemistry (Electrocatalysis); Lipkowski, J., Ross, P. N., Jr., Eds.; Wiley-VCH Publishers: New York, 1998; Vol. 4, Chapter 2.
-
(1998)
Frontiers of Electrochemistry (Electrocatalysis)
, vol.4
-
-
Ross P.N., Jr.1
-
2
-
-
0003636049
-
-
Wieckowski, A., Ed.; Marcel Dekker: New York, in press
-
Hamnett, A. In Interfacial Electrochemistry: Experimental, Theory and Applications; Wieckowski, A., Ed.; Marcel Dekker: New York, in press.
-
Interfacial Electrochemistry: Experimental, Theory and Applications
-
-
Hamnett, A.1
-
3
-
-
0003636049
-
-
Wieckowski, A., Ed.; Marcel Dekker: New York, in press
-
Chrzanowski, W.; Wieckowski, A. In Interfacial Electrochemistry: Experimental, Theory and Applications; Wieckowski, A., Ed.; Marcel Dekker: New York, in press.
-
Interfacial Electrochemistry: Experimental, Theory and Applications
-
-
Chrzanowski, W.1
Wieckowski, A.2
-
4
-
-
0000533005
-
-
Herrero, E.; Franaszczuk, K.; Wieckowski, A. J. Electroanal. Chem. 1993, 361, 269.
-
(1993)
J. Electroanal. Chem.
, vol.361
, pp. 269
-
-
Herrero, E.1
Franaszczuk, K.2
Wieckowski, A.3
-
6
-
-
0542373645
-
-
Chrzanowski, W.; Kim, H.; Wieckowski, A. Catal. Lett. 1998, 50, 69.
-
(1998)
Catal. Lett.
, vol.50
, pp. 69
-
-
Chrzanowski, W.1
Kim, H.2
Wieckowski, A.3
-
8
-
-
0002818467
-
-
Chrzanowski, W.; Kim, H.; Tremiliosi-Filho, G.; Wieckowski, A.; Grzybowska, B.; Kulesza, P. J. New Mater. Electrochem. Syst. 1998, 1, 31.
-
(1998)
J. New Mater. Electrochem. Syst.
, vol.1
, pp. 31
-
-
Chrzanowski, W.1
Kim, H.2
Tremiliosi-Filho, G.3
Wieckowski, A.4
Grzybowska, B.5
Kulesza, P.6
-
10
-
-
0001629002
-
-
Clavilier, J.; Llorca, M. J.; Feliu, J. M.; Aldaz, A. J. Electroanal. Chem. 1991, 310, 429.
-
(1991)
J. Electroanal. Chem.
, vol.310
, pp. 429
-
-
Clavilier, J.1
Llorca, M.J.2
Feliu, J.M.3
Aldaz, A.4
-
11
-
-
0346489010
-
-
Llorca, M. J.; Feliu, J. M.; Aldaz, A.; Clavilier, J. J. Electroanal. Chem. 1993, 351, 299.
-
(1993)
J. Electroanal. Chem.
, vol.351
, pp. 299
-
-
Llorca, M.J.1
Feliu, J.M.2
Aldaz, A.3
Clavilier, J.4
-
12
-
-
0000720259
-
-
Cramm, S.; Friedrich, K. A.; Geyzers, K.-P.; Stimming, U.; Vogel, R.; Fresenius J. Anal. Chem. 1997, 358, 189.
-
(1997)
Fresenius J. Anal. Chem.
, vol.358
, pp. 189
-
-
Cramm, S.1
Friedrich, K.A.2
Geyzers, K.-P.3
Stimming, U.4
Vogel, R.5
-
13
-
-
0000488150
-
-
Electrode Processes VI; Wieckowski, A., Itaya, K., Eds.; Pennington
-
Friedrich, K. A.; Geyzers, K.-P.; Henglein, F.; Marmann, A.; Stimming, U.; Unkauf W.; Vogel, R. In Electrode Processes VI; The ECS Proceedings; Wieckowski, A., Itaya, K., Eds.; 1996; Pennington, Vol. 96-8, p 119.
-
(1996)
The ECS Proceedings
, vol.96
, Issue.8
, pp. 119
-
-
Friedrich, K.A.1
Geyzers, K.-P.2
Henglein, F.3
Marmann, A.4
Stimming, U.5
Unkauf, W.6
Vogel, R.7
-
15
-
-
0000051792
-
-
Orts, J. M.; Gómez, R.; Feliu, J. M.; Aldaz, A.; Clavilier, J. J. Phys. Chem. 1996, 100, 2334.
-
(1996)
J. Phys. Chem.
, vol.100
, pp. 2334
-
-
Orts, J.M.1
Gómez, R.2
Feliu, J.M.3
Aldaz, A.4
Clavilier, J.5
-
16
-
-
0000507655
-
-
Orts, J. M.; Gómez, R.; Feliu, J. M.; Aldaz, A.; Clavilier, J. Langmuir 1997, 13, 3016.
-
(1997)
Langmuir
, vol.13
, pp. 3016
-
-
Orts, J.M.1
Gómez, R.2
Feliu, J.M.3
Aldaz, A.4
Clavilier, J.5
-
17
-
-
0343301621
-
-
Schardt, B. C.; Yau, S.-L.; Rinaldi, F. Science 1989, 243, 981.
-
(1989)
Science
, vol.243
, pp. 981
-
-
Schardt, B.C.1
Yau, S.-L.2
Rinaldi, F.3
-
18
-
-
0344109351
-
-
note
-
The quality of determination of the island heights (see the right-hand side insets in Figures 2-5) was assessed using the grain size option available on the Nanoscope software, version 4.22. The Ru monatomic island border was set at the island height over the Pt(111) terrace of 0.11 nm (0.11 nm corresponds to a half-distance between the Ru layer and Pt(111) surface layer in a closed-packed Ru configuration). This is well above any noise level displayed by the STM system. Therefore, the center of the island gave the expected height of ca. 0.22 nm, which fits well to the theoretical interlayer distance of 0.226 nm. Throughout this study, the 0.22 nm height was used as a marker of the STM piezoelectric device. The atoms at the border of the second layer (see further) were considered to be those that yielded the height of 0.33 nm: the Pt-Ru distance plus half the expected Ru-Ru distance for the second layer.
-
-
-
|