Resistivity of single- and multiple-domain thin films of from 0.05 to 500 K

Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 6, 1996, Pages R3776-R3779

  Lee, Mark ^a   Stutzman, M ^a   Suzuki, Y ^b   Geballe, T ^b  

^a University of Virginia   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344108354     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.R3776     Document Type: Article

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