Estimating intraclass correlation for binary data

Biometrics

Volumn 55, Issue 1, 1999, Pages 137-148

  Ridout, Martin S ^a   Demétrio, Clarice G B ^b   Firth, David ^c  

^a HORTICULTURE RESEARCH INTERNATIONAL   (United Kingdom)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

^c NUFFIELD COLLEGE   (United Kingdom)

Author keywords

Beta binomial; Extended quasi likelihood; Kappa coefficient; Pseudo likelihood

Indexed keywords

BETA-BINOMIAL; BINARY DATA; EXTENDED QUASI-LIKELIHOOD; EXTENSIVE SIMULATIONS; GENERAL METHOD; INTRACLASS CORRELATIONS; KAPPA COEFFICIENT; PSEUDO-LIKELIHOOD; QUASI-LIKELIHOOD; SIMULATION STUDIES;

ANALYTIC METHOD; ANALYTICAL ERROR; ARTICLE; CORRELATION FUNCTION; INTERMETHOD COMPARISON; PREDICTION; RELIABILITY; SIMULATION; STATISTICAL MODEL; VALIDATION PROCESS;

EID: 0344097409     PISSN: 0006341X     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0006-341X.1999.00137.x     Document Type: Article

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