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Volumn E86-C, Issue 11, 2003, Pages 2309-2319

Demodulation of Radio Frequency Interference in CMOS Operational Amplifiers

Author keywords

Electromagnetic interference (EMI); Harmonic distortion; Operational amplifier; Radio frequency interference; Volterra series

Indexed keywords

BANDWIDTH; CMOS INTEGRATED CIRCUITS; DEMODULATION; ELECTRIC POTENTIAL; FEEDBACK; HARMONIC DISTORTION; SIGNAL INTERFERENCE;

EID: 0344082647     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (17)
  • 1
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    • Richardson, R.E.1
  • 2
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    • A modified Ebers-Moll transistor model for RF-interference analysis
    • Nov.
    • C.E. Larson and J.M. Roe, "A modified Ebers-Moll transistor model for RF-interference analysis," IEEE Trans. Electromagn. Compat., vol.EMC-21, pp.283-290, Nov. 1979.
    • (1979) IEEE Trans. Electromagn. Compat. , vol.EMC-21 , pp. 283-290
    • Larson, C.E.1    Roe, J.M.2
  • 3
    • 0018546765 scopus 로고
    • Computer aided analysis of RFI effect in operational amplifiers
    • Nov.
    • J.G. Tront, J.J. Whalen, and C.E. Larson, "Computer aided analysis of RFI effect in operational amplifiers," IEEE Trans. Electromagn. Compat., vol.EMC-21, pp.297-306, Nov. 1979.
    • (1979) IEEE Trans. Electromagn. Compat. , vol.EMC-21 , pp. 297-306
    • Tront, J.G.1    Whalen, J.J.2    Larson, C.E.3
  • 4
    • 0026953386 scopus 로고
    • EMI-induced failures in integrated circuit operational amplifiers
    • S. Graffi, G. Masetti, and D. Golzio, "EMI-induced failures in integrated circuit operational amplifiers," Microelectron. Reliab., vol.32, no.11, pp.1551-1557, 1992.
    • (1992) Microelectron. Reliab. , vol.32 , Issue.11 , pp. 1551-1557
    • Graffi, S.1    Masetti, G.2    Golzio, D.3
  • 5
    • 0035785747 scopus 로고    scopus 로고
    • Prediction of RF interference in operational amplifiers by a new analytical model
    • Electromagnetic Compatibility, 2001, Montreal, Canada, Aug.
    • F. Fiori, P.S. Crovetti, and V. Pozzolo, "Prediction of RF interference in operational amplifiers by a new analytical model," Electromagnetic Compatibility, 2001. IEEE Int. Symp. on EMC 2001, vol.2, pp.1164-1168, Montreal, Canada, Aug. 2001.
    • (2001) IEEE Int. Symp. on EMC 2001 , vol.2 , pp. 1164-1168
    • Fiori, F.1    Crovetti, P.S.2    Pozzolo, V.3
  • 6
    • 0032655292 scopus 로고    scopus 로고
    • Failures induced on bipolar operational amplifiers from electromagnetic interferences conducted on the power supply rails
    • San Diego, CA
    • N. Speciale and G. Setti, "Failures induced on bipolar operational amplifiers from electromagnetic interferences conducted on the power supply rails," IEEE 37th Annual Int. Reliability Physics Symp., pp.727-730, San Diego, CA, 1999.
    • (1999) IEEE 37th Annual Int. Reliability Physics Symp. , pp. 727-730
    • Speciale, N.1    Setti, G.2
  • 8
    • 0026107990 scopus 로고
    • New macromodels and measurements for the analysis of EMI effects in 741 op-amp circuits
    • Feb.
    • S. Graffi, G. Masetti, and D. Golzio, "New macromodels and measurements for the analysis of EMI effects in 741 op-amp circuits," IEEE Trans. Electromagn. Compat., vol.EMC-33, pp.25-33, Feb. 1991.
    • (1991) IEEE Trans. Electromagn. Compat. , vol.EMC-33 , pp. 25-33
    • Graffi, S.1    Masetti, G.2    Golzio, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.