Design and non-iterative learning of multiple pattern storage in a modified Hopfield net

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5106, Issue , 2003, Pages 154-160

  Hu, Chia Lun John ^a  

^a SOUTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

Associative pattern storage; Feedback neural networks; Noise affected recalls of accurate patterns

Indexed keywords

ASSOCIATIVE STORAGE; CONVERGENCE OF NUMERICAL METHODS; ITERATIVE METHODS; LEARNING SYSTEMS; MATRIX ALGEBRA; RECURRENT NEURAL NETWORKS;

PATTERN STORAGE;

PATTERN RECOGNITION;

EID: 0344082592     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.501407     Document Type: Conference Paper

References (7)

1. C. J. Hu, Pattern Recognition Using Noniteratively Learned Perceptron," Proc. IEEE Intern. Conf. on Syst., Mam, Cybernetics, Orlando, FL, Oct. 12-15, 1997.
2. C. J. Hu, "An optimally robust, fast-learning, pattern recognizer derived from a noniterative neural network learning theory," Proc. First Intern'l Conf. on Information, Communications, & Signal Processing, Singapore, Sept. 9-12, 1997
3. C. J. Hu, "Automatic feature extraction using N-dimension convexity concept in a novel neural network," Vision Geometry VIII, International SPIE Conference, Denver, CO, July 20, 1999
4. C. J. Hu, "A Novel, Fast-Learning, Noniterative Neural Network Used in Pattern Recognition," International Joint Conference on Neural Networks, Washington, D.C., July 12, 1999
5. C. J. Hu, "Universal 2-layered noniterative perceptron for recognizing closely related patterns," Proc. of Signal Processing, Sensor Fusion, and Target Recognition IX, SPIE, Orlando, FL, April 24-28, 2000.
6. C. J. Hu, "Separate the inseparable one-layered mapping" Proceeding of Applications of Artificial Neural Networks in Image Processing, V, EI 2000, San Jose, CA, Jan. 24-28, 2000.
7. C. J. Hu, "Parallel-Cascaded Noniterative Neural Network for Identifying Closely Related Optical Patterns," Proceeding of Optical Pattern Recognition XI, SPIE, Orlando, FL, April 24-28, 2000.