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Volumn 49, Issue 11, 2003, Pages 46-49
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Silicon takes the strain
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
CMOS INTEGRATED CIRCUITS;
CRYSTAL STRUCTURE;
ELECTRON ENERGY LEVELS;
FIELD EFFECT TRANSISTORS;
INDUSTRIAL RESEARCH;
INTEGRATED CIRCUITS;
LATTICE CONSTANTS;
PHONONS;
QUANTUM THEORY;
SILICON WAFERS;
ACOUSTIC ENERGY;
SEMICONDUCTOR INDUSTRY;
MICROELECTRONICS;
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EID: 0344081198
PISSN: 00135127
EISSN: None
Source Type: Journal
DOI: 10.1049/ir:20031107 Document Type: Review |
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Times cited : (6)
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References (0)
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