Microstructural and Microchemical Analysis of Chalcopyrite Cu(In,Ga)Se 2 Films

Materials Research Society Symposium - Proceedings

Volumn 763, Issue , 2003, Pages 169-174

  Li, Chun Ming ^a   Lei, Chang Hui ^a   Robertson, Ian M ^a   Rockett, Angus ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; GRINDING (MACHINING); MICROSTRUCTURE; MILLING (MACHINING); PHASE DIAGRAMS; PHOTOLUMINESCENCE; SOLAR CELLS; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

GRAIN INTERIORS; MICROCHEMICAL ANALYSIS;

COPPER COMPOUNDS;

EID: 0344065567     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-763-b4.2     Document Type: Conference Paper

References (6)

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2. D. Tarrant, Siemens Solar Industries, via K. Zweibel, private communication.
3. For an up to date listing, see http://www.nrel.gov/ncpv/thinfilms2.html.
4. L. Kronik, U. Rau, J-F. Guillemoles, D. Braunger, H-W. Schock, D. Cahen, Thin Solid Films, 361-362, 353-359 (2000).
5. M. Bodegard, K. Granath, L. Stolt, Thin Solid Films, 361-362, 9-16 (2000).
6. A. Rockett, J.S. Britt, T. Gillespie, C. Marshall. M.M. Al Jassim, F. Jasoon, R. Matson, B. Basol, Thin Solid Films, 372 (1-2), 212-217 (2000).