Measurements of very low energy secondary and backscattered electron coefficients

Journal of Computer-Assisted Microscopy

Volumn 9, Issue 2, 1997, Pages 123-124

  Zadrazil, M ^a   El Gomati, M ^b   Walker, A ^c  

^a INSTITUTE OF SCIENTIFIC INSTRUMENTS   (Czech Republic)

^b UNIVERSITY OF YORK   (United Kingdom)

^c UNIVERSITY OF EAST ANGLIA   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344042381     PISSN: 10407286     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (2)

1. Matthew, J., Jackson, A., and El Gomati, M. (1997). J. Electron Spec. Rel. Phen. 85:205-219.
2. El Gomati, M., and Asaa'd, A. (1997). Mikrochemica Acta.