Measurement of Mode Patterns in a High-Power Microwave Cavity

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 6, 2003, Pages 1815-1819

  Kharkovsky, Sergey N ^a,b   Hasar, Ugur C ^a  

^a CUKUROVA UNIVERSITY   (Turkey)

^b University of Missouri Rolla   (United States)

Author keywords

Calibration; Exposure time; High power; Measurement; Microwave cavity; Mode patterns; Wet thermal paper method

Indexed keywords

CALIBRATION; CELL CULTURE; ELECTRIC GENERATORS; MICROWAVES; PERMITTIVITY;

EXPOSURE TIME; HEAT DISTRIBUTIONS; MODE PATTERNS; WET THERMAL PAPER;

MICROWAVE OVENS;

EID: 0344013015     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.820453     Document Type: Article

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