A method based on stochastic resonance for the detection of weak analytical signal

Talanta

Volumn 61, Issue 6, 2003, Pages 863-869

  Wu, Xiaojing ^a   Guo, Weiming ^a   Cai, Wensheng ^a   Shao, Xueguang ^a   Pan, Zhongxiao ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Detection of weak signal; Raman spectrum; Signal processing; Stochastic resonance; X ray

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; RAMAN SPECTROSCOPY; SPURIOUS SIGNAL NOISE; X RAY DIFFRACTION ANALYSIS;

ANALYTICAL SIGNALS; STOCHASTIC RESONANCE (SR);

SIGNAL DETECTION;

ALGORITHM; ANALYTIC METHOD; ARTICLE; EXPERIMENT; INTERMETHOD COMPARISON; NOISE; PARAMETER; PERFORMANCE; RAMAN SPECTROMETRY; RELIABILITY; SIGNAL DETECTION; SIGNAL PROCESSING; SIMULATION; STOCHASTIC RESONANCE; X RAY DIFFRACTION;

EID: 0344012109     PISSN: 00399140     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-9140(03)00371-0     Document Type: Article

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