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Volumn 64, Issue 2, 1998, Pages 85-93

X-ray fluorescence trace analysis of materials (review)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0343984416     PISSN: 00198447     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (1)

References (65)
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    • W. Swoboda et al., X-Ray Spectrom., 22(4), 317-322 (1993).
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    • Daroso, P.A.1
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    • Posokha, A.K.1
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    • A. Prange et al., Anal. Sci., 11(3), 483-487 (1995).
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    • Prange, A.1
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    • T. Ninomiya et al., Anal. Sci. 11(3), 489-494 (1995).
    • (1995) Anal. Sci. , vol.11 , Issue.3 , pp. 489-494
    • Ninomiya, T.1
  • 59
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    • A. Rind, X-Ray Spectrom., 22(4), 187-191 (1993).
    • (1993) X-Ray Spectrom. , vol.22 , Issue.4 , pp. 187-191
    • Rind, A.1
  • 60
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    • D. J. Thiel et al., Rev. Sci. Instr., 64(10), 2872-2878 (1993).
    • (1993) Rev. Sci. Instr. , vol.64 , Issue.10 , pp. 2872-2878
    • Thiel, D.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.