Electrical properties of Na2US3, NaGdS2 and NaLaS2

Materials Research Bulletin

Volumn 34, Issue 8, 1999, Pages 1291-1300

  Masuda, Hidetoshi ^a   Fujino, Takeo ^a   Sato, Nobuaki ^a   Yamada, Kohta ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CARRIER CONCENTRATION; CRYSTAL STRUCTURE; CURRENT DENSITY; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON ENERGY LEVELS; HALL EFFECT; SEMICONDUCTOR MATERIALS; TEMPERATURE; X RAY CRYSTALLOGRAPHY;

CHALCOGENIDES; SODIUM GADOLINIUM SULFIDE; SODIUM LANTHANUM SULFIDE; SODIUM URANIUM SULFIDE; URANIUM SULFIDE; VAN DER PAUW METHOD;

SULFUR COMPOUNDS;

EID: 0343962738     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(99)00125-7     Document Type: Article

References (13)

1. Masuda H., Fujino T., Sato N., Yamada K., Wakeshima M. J. Alloys Compd. 284:1999;117.
2. Ohtani T., Honjo H., Wada H. Mater. Res. Bull. 22:1987;829.
3. Sato M., Adachi G., Shiokawa J. Mater. Res. Bull. 19:1984;1215.
4. Fujino T., Nakama S., Sato N., Yamada K., Fukuda K., Serizawa H., Shiratori T. J. Nucl. Mater. 246:1997;150.
5. Yvon K., Jeitschko W., Parthe E. J. Appl. Crystallogr. 10:1977;73.
6. D.E. Williams, Ames Lab. Rep. IS-1052, 1964.
7. F. Izumi, in The Rietveld Method, ed. R.A. Young, Chap. 13, Oxford University Press, Oxford (1993).
8. van der Pauw L.J. Philips Res. Rep. 13:1958;1.
9. Plug C.M., Prodan A. Acta Crystallogr. A. 34:1978;250.
10. Seeger K. Semiconductor Physics - An Introduction. 1989;Springer-Verlag, Berlin.
11. Parlak M., Erçelebi Ç., Günal I., Özkan H., Gasanly N.M., Çulfaz A. Cryst. Res. Technol. 32:1997;395.
12. Mandrus D., Migliori A., Darling T.W., Hundley M.F., Peterson E.J., Thompson J.D. Phys. Rev. B. 52:1995;4926.
13. Lin S.S., Huang J.K., Huang Y.S. Mater. Res. Bull. 27:1992;177.