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Volumn 158, Issue 1, 1999, Pages 533-537

Fluid inclusion depth and thickness estimates using a Na nuclear reaction resonance and Si elastic scattering

Author keywords

[No Author keywords available]

Indexed keywords

INCLUSIONS; QUARTZ; RESONANCE; SILICON; SODIUM; TRACE ANALYSIS; TRACE ELEMENTS; X RAY ANALYSIS;

EID: 0343962240     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00350-X     Document Type: Article
Times cited : (9)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.