|
Volumn 158, Issue 1, 1999, Pages 533-537
|
Fluid inclusion depth and thickness estimates using a Na nuclear reaction resonance and Si elastic scattering
|
Author keywords
[No Author keywords available]
|
Indexed keywords
INCLUSIONS;
QUARTZ;
RESONANCE;
SILICON;
SODIUM;
TRACE ANALYSIS;
TRACE ELEMENTS;
X RAY ANALYSIS;
FLUID INCLUSION ANALYSIS;
NUCLEAR REACTION ANALYSIS;
NUCLEAR INSTRUMENTATION;
|
EID: 0343962240
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(99)00350-X Document Type: Article |
Times cited : (9)
|
References (12)
|