Bis(μ-{N-[(methylthio)phenylmethylene]-methanamine N-oxide}-O:O)bis[bis-(1,1,1,5,5,5-hexafluoropentane-2,4-dionato-0,0′) nickel(II)]

Acta Crystallographica Section C: Crystal Structure Communications

Volumn 54, Issue 7, 1998, Pages 929-930

  Dickman, Michael H ^a   Ward, Jeffrey P ^a   Villamena, Frederick A ^a   Crist, Delanson R ^a  

^a GEORGETOWN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343954167     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270198000730     Document Type: Article

References (8)

1. Blessing, R. (1995). Acta Cryst. A51, 33-38.
2. Carducci, M. D. & Doedens, R. J. (1989). Inorg. Chem. 28, 2492-2494.
3. Coates, R. M. & Firsan, S. J. (1986). J. Org. Chem. 51, 5198-5209.
4. Sheldrick, G. M. (1990). Acta Cryst. A46, 467-473.
5. Sheldrick, G. M. (1993a). SHELXL93. Program for the Refinement of Crystal Structures. University of Göttingen, Germany.
6. Sheldrick, G. M. (1993b). SHELXTL. Structure Determination Software Programs. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
7. Siemens (1995). SMART and SAINT. Area Detector Control and Integration Software. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
8. Villamena, F. A., Dickman, M. H. & Crist, D. R. (1998). Inorg. Chem. 37, 1446-1453.