Defect structure of electrodeposited chromium layers

Radiation Physics and Chemistry

Volumn 58, Issue 5-6, 2000, Pages 693-696

  Marek, T ^a   Suvegh K ^a   Vertes A ^a   El Sharif, M ^b   McDougall, J ^b   Chisolm, C U ^b  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

^b GLASGOW CALEDONIAN UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; CRYSTAL DEFECTS; ELECTRODEPOSITION; ELECTROLYTIC POLISHING; ELECTROPLATING; POSITRONS; SPECTROSCOPY; SUBSTRATES;

MECHANICAL POLISHING; POSITRON ANNIHILATION SPECTROSCOPY;

CHROMIUM;

CHROMIUM;

CHEMICAL STRUCTURE; COMPLEX FORMATION; CONFERENCE PAPER; ELECTROLYSIS; FILM; POSITRON; SPECTROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY;

EID: 0343932814     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0969-806X(00)00241-3     Document Type: Conference Paper

References (5)

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2. MacKenzie I.K. Experimental methods of annihilation time and energy spectroscopy. Brandt W., Dupasquier A. Positron Solid-State Physics. 1983;196 North-Holland, Amsterdam.
3. Schaffer J.P., Dewald A.B., Frost R.L., Perry A.J., Nielsen B., Lynn K.G. Positron annihilation spectroscopy of the defect structure of sputter-deposited TiN. Surface and Coatings Techn. 36:1988;593.
4. Süvegh K., Domján A., Vértes A., El-Sharif M., McDougall J., Chisholm C.U. Application of positron lifetime spectroscopy to the study of electrodeposited chromium layers. J. Electroanal. Chem. 455:1998;69.
5. van Veen A., Kruseman A.C., Schut H., Mijnarends P.E., Kooi B.J., De Hosson J.T.M. Positron analysis of defects in metals. Mater. Sci. Forum. 255:1997;76.