Resolution in surface plasmon microscopy

Review of Scientific Instruments

Volumn 65, Issue 9, 1994, Pages 2829-2836

  Berger, Charles E H ^a   Kooyman, Rob P H ^a   Greve, Jan ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343924049     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1144623     Document Type: Article

References (14)