A comparative study of X-ray absorption spectroscopy at various synchrotron facilities and the effect of transverse source coherence

Journal of Electron Spectroscopy and Related Phenomena

Volumn 113, Issue 1, 2000, Pages 67-77

  Hunter Dunn, J ^a   Arvanitis, D ^b   Baberschke, K ^a   Hahlin, A ^b   Karis, O ^b   Carr, R ^b   Martensson N ^b  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; COPPER; DEPOSITION; DIFFRACTION; IRON; METALLIC FILMS; RESONANCE; SYNCHROTRON RADIATION; THIN FILMS; X RAY SPECTROSCOPY;

X RAY ABSORPTION SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 0343898111     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(00)00223-1     Document Type: Review

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