Thin-Film Study using Low-Incidence and Bragg-Brentano Texture Goniometry. Application to Mono- And Bilayers of Al and Al/Fe

Journal of Applied Crystallography

Volumn 29 PART 5, Issue , 1996, Pages 531-539

  Tizliouine, A ^a   Bessieres J ^a   Heizmann, J J ^a   Bobo, J F ^b  

^a ISGMP   (France)

^b UNIVERSITÉ DE LORRAINE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343890650     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889896003809     Document Type: Article

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