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Volumn 187, Issue , 1995, Pages 216-220
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The no-thermal activation of the defect generation mechanism in a MOS structure
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0343886439
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-3093(95)00141-7 Document Type: Article |
Times cited : (3)
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References (15)
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