EELS characterization of TiN grown by the DC sputtering technique

Journal of Electron Spectroscopy and Related Phenomena

Volumn 105, Issue 2-3, 1999, Pages 129-133

  Contreras, O ^a   Duarte Moller, A ^b,c   Hirata, G A ^b   Avalos Borja, M ^b  

^a CENTRO DE INVESTIGACIÓN CIENTÍFICA Y DE EDUCACIÓN SUPERIOR DE ENSENADA   (Mexico)

^b CENTRO DE CIENCIAS DE LA MATERIA CONDENSADA   (Mexico)

^c CENTRO DE INVESTIGACIÓN EN MATERIALES AVANZADOS   (Mexico)

Author keywords

EELS; EXELFS; RDF; Tin

Indexed keywords

EID: 0343885624     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(99)00061-4     Document Type: Article

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