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Volumn 27, Issue 1, 2000, Pages 9-13

Optically tunable millimeter-wave attenuator based on layered structures

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVE ATTENUATION; MILLIMETER WAVE DEVICES; OPTICAL WAVEGUIDES; SILICON WAFERS;

EID: 0343878761     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/1098-2760(20001005)27:1<9::aid-mop4>3.0.co;2-j     Document Type: Article
Times cited : (10)

References (12)
  • 2
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    • Z. Wang and Y. Chu, Use of microwave photoconductivity to measure semiconductor properties, Solid-State Electron 34 (1991), 735-740.
    • (1991) Solid-State Electron , vol.34 , pp. 735-740
    • Wang, Z.1    Chu, Y.2
  • 3
    • 0026222790 scopus 로고
    • Characterization of silicon wafers by transient microwave photoconductivity
    • A. Sanders and M. Kunst, Characterization of silicon wafers by transient microwave photoconductivity, Solid-State Electron 34 (1991), 1007-1015.
    • (1991) Solid-State Electron , vol.34 , pp. 1007-1015
    • Sanders, A.1    Kunst, M.2
  • 5
    • 0343215812 scopus 로고    scopus 로고
    • HP product note 8510-3
    • HP product note 8510-3.
  • 6
    • 0025474631 scopus 로고
    • Improved technique for determining complex permittivity with the transmission/reflection method
    • J. Baker-Jarvis and E.J. Vanzura, Improved technique for determining complex permittivity with the transmission/reflection method, IEEE Trans 38 (1990), 1096-1101.
    • (1990) IEEE Trans , vol.38 , pp. 1096-1101
    • Baker-Jarvis, J.1    Vanzura, E.J.2
  • 7
    • 0343651439 scopus 로고    scopus 로고
    • Complex dielectric constant measurements and model comparison of lossy dielectric materials
    • Salt Lake City, UT, July
    • S. Lee and Y. Kuga, Complex dielectric constant measurements and model comparison of lossy dielectric materials, 2000 IEEE AP-S Int Symp, Salt Lake City, UT, July 2000.
    • (2000) 2000 IEEE AP-S Int Symp
    • Lee, S.1    Kuga, Y.2
  • 10
    • 0342346222 scopus 로고
    • Lifetime measurements on silicon-on-insulator wafers
    • J. Freeouf, N. Brasiau, and M. Wittmer, Lifetime measurements on silicon-on-insulator wafers, Appl Phys Lett 63 (1993), 189-190.
    • (1993) Appl Phys Lett , vol.63 , pp. 189-190
    • Freeouf, J.1    Brasiau, N.2    Wittmer, M.3
  • 11
    • 0038757502 scopus 로고
    • Optoelectronic transmission and reception of ultrashort electrical pulses
    • A. DeFonzo and C. Lutz, Optoelectronic transmission and reception of ultrashort electrical pulses, Appl Phys Lett 51 (1987), 212-214.
    • (1987) Appl Phys Lett , vol.51 , pp. 212-214
    • DeFonzo, A.1    Lutz, C.2
  • 12
    • 0000650579 scopus 로고
    • Coherent broadband microwave spectroscopy using picosecond optoelectronic antennas
    • Y. Pastol, G. Arjavalingam, J. Halbout, and G. Kopcsay, Coherent broadband microwave spectroscopy using picosecond optoelectronic antennas, Appl Phys Lett 54 (1989), 307-309.
    • (1989) Appl Phys Lett , vol.54 , pp. 307-309
    • Pastol, Y.1    Arjavalingam, G.2    Halbout, J.3    Kopcsay, G.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.