Characterization of Pd-Au/SiO2 catalysts by X-ray diffraction, temperature-programmed hydride decomposition, and catalytic probes

Journal of Catalysis

Volumn 195, Issue 2, 2000, Pages 304-315

  Bonarowska, M ^a   Pielaszek, J ^a   Juszczyk, W ^a   Karpinski Z ^a  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

2,2 dimethylpropane conversion; Pd Au SiO2; Probing degree of homogeneity; Temperature programmed hydride decomposition (TPHD); X ray diffraction

Indexed keywords

EID: 0343878062     PISSN: 00219517     EISSN: None     Source Type: Journal    
DOI: 10.1006/jcat.2000.2989     Document Type: Article

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