Surface morphology and structure of epitaxial yttrium on niobium buffer layers with different orientations

Journal of Physics Condensed Matter

Volumn 12, Issue 22, 2000, Pages 4675-4686

  Krause, B ^a,b   Theis Brohl K ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; FILM GROWTH; MORPHOLOGY; NIOBIUM; SURFACE ROUGHNESS; SURFACES; TEMPERATURE; X RAY ANALYSIS;

CRYSTALLINITY; EPITAXIAL YTTRIUM FILMS; NIOBIUM BUFFER LAYERS; X RAY MEASUREMENTS;

YTTRIUM;

EID: 0343878055     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/12/22/301     Document Type: Article

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