Structural Features at the Si — Sio2 Interface

Zeitschrift fur Physikalische Chemie

Volumn 151, Issue PART_1_2, 1987, Pages 177-189

  Brower, Keith L ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343874915     PISSN: 09429352     EISSN: None     Source Type: Journal    
DOI: 10.1524/zpch.1987.151.Part_1_2.177     Document Type: Article

References (14)

1. Y. Nishi, Jpn. J. Appl. Phys. 10 (1971) 52.
2. P. J. Caplan, E. H. Poindexter, B. E. Deal and R. R. Razouk, J. Appl. Phys. 50 (1979) 5847.
3. 2and its Interfaces (Ed. S. T. Pantelides), p. 356. Pergamon Press, New York, 1978.
4. J. H. Mazur, R. Gronsky and J. Washburn, Proc. of the SPIE Conference 463 (1984) 88.
5. E. H. Poindexter, P. J. Caplan, B. E. Deal and R. R. Razouk, J. Appl. Phys. 52 (1981) 879.
6. K. L. Brower, Rev. Sci. Instrum. 48 (1977) 135.
7. E. Sirtl and A. Adler, Z. Metallk. 52 (1961) 529.
8. K. L. Brower, Appl. Phys. Lett. 43 (1983) 1111.
9. K. L. Brower, Phys. Rev. B5 (1972) 4274.
10. K. L. Brower, Phys. Rev. B33 (1986) 4471.
11. A. Stesmans, Appl. Phys. Lett. 48 (1986) 972.
12. G. D. Watkins and J. W. Corbett, Phys. Rev. 134 (1964) A1359.
13. K. L. Brower, Phys. Rev. B 34 (1986) 3610.
14. M. Sprenger, Ph. D. Thesis, University of Amsterdam, 1986.