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Volumn 375, Issue 1-2, 2000, Pages 15-18

Phase transition related stress in ferroelectric thin films

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; FERROELECTRIC MATERIALS; PHASE TRANSITIONS; STRESS CONCENTRATION; THERMOANALYSIS; THIN FILMS;

EID: 0343844410     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01171-8     Document Type: Article
Times cited : (14)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.