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Volumn 375, Issue 1-2, 2000, Pages 15-18
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Phase transition related stress in ferroelectric thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTATIONAL METHODS;
FERROELECTRIC MATERIALS;
PHASE TRANSITIONS;
STRESS CONCENTRATION;
THERMOANALYSIS;
THIN FILMS;
LANDAU THEORY;
DIELECTRIC FILMS;
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EID: 0343844410
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(00)01171-8 Document Type: Article |
Times cited : (14)
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References (14)
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