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Volumn 341-348, Issue PART 2, 2000, Pages 1767-1770
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La-214 thin films under epitaxial strain
a b a a,b |
Author keywords
[No Author keywords available]
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Indexed keywords
ANTIFERROMAGNETISM;
CARRIER CONCENTRATION;
CHEMICAL BONDS;
ELECTRIC CONDUCTIVITY MEASUREMENT;
EVAPORATION;
LATTICE CONSTANTS;
PHASE DIAGRAMS;
SUPERCONDUCTING FILMS;
SUPERCONDUCTING TRANSITION TEMPERATURE;
X RAY DIFFRACTION ANALYSIS;
ANTIFERROMAGNETIC SPIN FLUCTUATION;
EPITAXIAL STRAIN;
LOW TEMPERATURE TETRAGONAL;
POISSON EFFECT;
OXIDE SUPERCONDUCTORS;
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EID: 0343832902
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(00)01017-0 Document Type: Article |
Times cited : (7)
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References (21)
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