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Volumn 341-348, Issue PART 2, 2000, Pages 1767-1770

La-214 thin films under epitaxial strain

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETISM; CARRIER CONCENTRATION; CHEMICAL BONDS; ELECTRIC CONDUCTIVITY MEASUREMENT; EVAPORATION; LATTICE CONSTANTS; PHASE DIAGRAMS; SUPERCONDUCTING FILMS; SUPERCONDUCTING TRANSITION TEMPERATURE; X RAY DIFFRACTION ANALYSIS;

EID: 0343832902     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(00)01017-0     Document Type: Article
Times cited : (7)

References (21)
  • 7
  • 11
    • 44049115446 scopus 로고
    • F. C. Chou et al., Physiea C 197, 303 (1992).
    • (1992) Physiea C , vol.197 , pp. 303
    • Chou, F.C.1
  • 12
    • 0030263981 scopus 로고    scopus 로고
    • C. Rial et al., Physica C 270, 51 (1996).
    • (1996) Physica C , vol.270 , pp. 51
    • Rial, C.1
  • 13
    • 0031189147 scopus 로고    scopus 로고
    • H. Sato et al., Physica C 280, 178 (1997).
    • (1997) Physica C , vol.280 , pp. 178
    • Sato, H.1
  • 14
    • 33645244592 scopus 로고    scopus 로고
    • unpublished
    • H. Sato et al., unpublished.
    • Sato, H.1
  • 17
    • 0026105197 scopus 로고
    • Y. Maeno et al., Physica C 173, 322 (1991).
    • (1991) Physica C , vol.173 , pp. 322
    • Maeno, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.