Modeling scheme describes GaAs HBT noise performance

Microwaves and RF

Volumn 35, Issue 10, 1996, Pages 59-64

  Henderson, Gregory N ^a   Wu, Derwoei ^a  

^a M/A COM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343793100     PISSN: 07452993     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (4)

1. K. W. Kobayashi and A. Oki, Proceedings of the IEEE GaAs IC Symposium, 1994, pp. 303-306.
2. K.W. Kobayashi, A.K. Oki, L.T. Tran, D.K. Umemoto, and D.C. Streit, Proceedings of the IEEE MTT-S Symposium, 1994, pp. 17-20.
3. V. Adamian and A. Uhlir Jr., IEEE Transactions on Instrumentation and Measurement, Vol. 22, No. 2, 1973, pp. 181-182.
4. D.-W. Wu, D.L. Miller, M. Fukuda, and Y.-H. Yun, Proceedings of the IEEE GaAs IC Symposium, 1993, pp. 259-262.